The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured
The Fischerscope XDV-SD is an X-ray fluorescence spectrometer that has been developed specifically for the challenges in connection with RoHS / WEEE analyses.
When making measurements with the FISCHERSCOPE X-ray instruments, the WinFTM V.6.15 software automatically generates a complete image of large-area specimens comprised of partial images.
